LIPFD-NPU: Low-overhead Instruction-driven Permanent Fault Detection for Neural Processing Unit

Pengfei Wu, Z. Wang, Zhiming Pan, Weilun Wang
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Abstract

Neural Processing Unit (NPU) has become the state-of-the-art solution for accelerating artificial neural networks and is increasingly integrated on the System-on-Chip (SoC) of edge devices such as smartphones and cameras. However, adopting NPU in mission-critical systems, such as aerospace aircraft and autonomous driving demands high reliability, which is currently less explored on industrial NPUs. In this work, we target one of the critical reliability issues - permanent fault - for modern NPUs and provide an instruction-driven fault detection method named LIPFD-NPU. The approach executes dedicated network instructions in a self-testing fashion and generates fine-grained information on the potential fault's location, type and level of impact. An FPGA-based fault emulation framework is used to verify LIPFD-NPU. The results indicate that LIPFD-NPU effectively detects faults with tiny overheads of 0.2% in silicon area and 0.5% in power consumption.
LIPFD-NPU:低开销指令驱动的神经处理单元永久故障检测
神经处理单元(NPU)已成为加速人工神经网络的最先进解决方案,并越来越多地集成在智能手机和相机等边缘设备的片上系统(SoC)上。然而,在关键任务系统(如航空航天飞机和自动驾驶)中采用NPU需要高可靠性,目前在工业NPU上的探索较少。在这项工作中,我们针对现代npu的关键可靠性问题之一-永久故障,并提供了一种名为LIPFD-NPU的指令驱动故障检测方法。该方法以自我测试的方式执行专用的网络指令,并生成有关潜在故障的位置、类型和影响级别的细粒度信息。采用基于fpga的故障仿真框架对LIPFD-NPU进行了验证。结果表明,LIPFD-NPU可以有效地检测故障,而硅面积的开销仅为0.2%,功耗仅为0.5%。
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