Yi Liu, Julien Béguinot, Wei Cheng, S. Guilley, Loïc Masure, O. Rioul, François-Xavier Standaert
{"title":"Improved Alpha-Information Bounds for Higher-Order Masked Cryptographic Implementations","authors":"Yi Liu, Julien Béguinot, Wei Cheng, S. Guilley, Loïc Masure, O. Rioul, François-Xavier Standaert","doi":"10.1109/ITW55543.2023.10161608","DOIUrl":null,"url":null,"abstract":"Embedded cryptographic devices are usually protected against side-channel attacks by masking strategies. In this paper, the security of protected cryptographic implementations is evaluated for any masking order, using alpha-information measures. Universal upper bounds on the probability of success of any type of side-channel attack are derived. These also provide lower bounds on the minimum number of queries required to achieve a given success rate. An important issue, solved in this paper, is to remove the loss factor due to the masking field size.","PeriodicalId":439800,"journal":{"name":"2023 IEEE Information Theory Workshop (ITW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Information Theory Workshop (ITW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITW55543.2023.10161608","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Embedded cryptographic devices are usually protected against side-channel attacks by masking strategies. In this paper, the security of protected cryptographic implementations is evaluated for any masking order, using alpha-information measures. Universal upper bounds on the probability of success of any type of side-channel attack are derived. These also provide lower bounds on the minimum number of queries required to achieve a given success rate. An important issue, solved in this paper, is to remove the loss factor due to the masking field size.