Quantitative Phase Microscopy by Multi-wavelength Phase-Shifting Interference Microscopy

2007 Conference on Lasers and Electro-Optics (CLEO) Pub Date : 2007-05-06 DOI:10.1109/CLEO.2007.4453095

N. Warnasooriya, M. Kim

引用次数: 0

Abstract

The phase-shifting interference microscopy is combined with the multi-wavelength optical phase unwrapping to obtain quantitative phase profiles of microscopic objects without 2 pi discontinuities. Due to broadband light sources, images are less affected by coherent noise.

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多波长移相干涉显微定量相显微镜

将移相干涉显微技术与多波长光学相位展开相结合，得到无2 π不连续的微观物体的定量相位轮廓。由于采用宽带光源，图像受相干噪声的影响较小。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2007 Conference on Lasers and Electro-Optics (CLEO)

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