Influence of X-Ray Irradiation on Energy Pseudogap and Refractive Index of (Ga0.1In0.9)2Se3Films

Abstract

Thermal evaporation technique was used to deposite $\gamma_{1}$ films. As-deposited thin films were irradiated by means of wideband radiation of Cu-anode X-ray tube at different exposition times. Spectral ellipsometry measurements were conducted in order to obtain refractive index and extinction coefficient dispersions. Optical transmission spectra of X-ray irradiated $(\text{Ga}_{X}\text{In}_{1\rightarrow x})_{2}\text{Se}_{3}$ films were measured depending on irradiation time. Parameters of Urbach absorption edge for X-ray irradiated $(\mathbf{Ga}_{0.1}\mathbf{In}_{0.9})_{2}\mathbf{Se}_{3}$ films were studied. The investigation revealed the nonlinear decrease of energy pseudogap together with nonlinear increase of Urbach energy and refractive index, as well as the increase of X-ray irradiation time.