Micro-displacement sensor using a Mach-Zehnder interferometer with long-period gratings

K. Salas-Alcántara, I. Torres-Gómez, D. Monzón-Hernández, A. Martínez-Ríos, Luis Armando García-de-la-Rosa
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Abstract

We present the fabrication and characterization of a micro-displacement sensor using Mach-Zehnder interferometer in conventional optical fiber SMF28-e. The Mach-Zehnder interferometer uses a configuration of two long-period gratings (LPG) in series mechanically induced. The Mach-Zehnder interferometers were made to operate in the region of 1300 nm. As a result the interferometers were obtained with transmission bands with a bandwidth of 2 nm, extinction ratio of 12 dB and insertion loss of 2 to 3 dB. The characterization of the interferometer was found to be measured displacements up to 500 μm with a resolution of 7 microns, which envisions potential applications of micro-displacement sensor in the measurement of micro-deformations.
微位移传感器采用长周期光栅马赫-曾德尔干涉仪
本文介绍了在传统光纤SMF28-e中使用马赫-曾德尔干涉仪制作微位移传感器并进行了表征。Mach-Zehnder干涉仪采用两个长周期光栅(LPG)串联机械诱导的结构。马赫-曾德尔干涉仪工作在1300 nm范围内。结果表明,该干涉仪的传输带宽为2 nm,消光比为12 dB,插入损耗为2 ~ 3 dB。该干涉仪的测量位移可达500 μm,分辨率为7微米,这预示着微位移传感器在微变形测量中的潜在应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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