Recognition of Nanocomposites Agglomeration in Scanning Electron Microscopy Image with Semantic Segmentation Algorithm

Yu Bai, D. Qiang, Yanru Zhang, Xinyu Wang, Xu Zhuang, George Chen, Yan Wang
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Abstract

Agglomeration is a major challenge in the research of nanodielectrics. Recognition of agglomerates in scanning electron microscopy (SEM) images can effectively support tackle this issue. Motivated by the fast development of image recognition, we propose a new approach for agglomerates recognition in SEM images of nanodielectrics by semantic segmentation algorithm. On the basis of convolutional neural network, pixel blocks classification network and full convolutional segmentation network employed with data augmentation are investigated in this work. Both networks can preliminarily recognize the agglomerates of spherical silica-based blend polyethylene nanocomposites. The average intersection over union (mIoU) of the pixel blocks classification network is 0.837 and it takes 48 seconds to process an image, while the mIoU of the full convolutional segmentation network is 0.777 and it takes 0.059 seconds to process an image.
基于语义分割算法的扫描电镜图像中纳米复合材料结块识别
团聚是纳米电介质研究中的一个重大挑战。扫描电镜(SEM)图像中团块的识别可以有效地解决这一问题。在图像识别技术快速发展的背景下,提出了一种基于语义分割算法的纳米电介质扫描电镜图像团块识别新方法。在卷积神经网络的基础上,研究了采用数据增强的像素块分类网络和全卷积分割网络。两种网络都能初步识别球形硅基共混聚乙烯纳米复合材料的团聚体。像素块分类网络的平均mIoU为0.837,处理一幅图像耗时48秒,而全卷积分割网络的mIoU为0.777,处理一幅图像耗时0.059秒。
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