Turnkey industrial instrumentation for fast-response, on-line analysis of ppb impurities in the electronic semiconductor gases

R. Mever, J. E. Perez, S. Strickland
{"title":"Turnkey industrial instrumentation for fast-response, on-line analysis of ppb impurities in the electronic semiconductor gases","authors":"R. Mever, J. E. Perez, S. Strickland","doi":"10.1109/LEOSST.2000.869720","DOIUrl":null,"url":null,"abstract":"A totally integrated hardware and software gas analysis system, IRGAS/sup TM/, is newly available to the semiconductor process engineer to monitor the ppb quality level of the corrosive and toxic cleaning and etching gases in real-time and on-line with process tools in a fab plant. The IRGAS/sup TM/ system is based upon an industrial-ruggedized FTIR spectrometer coupled with a nickel-plated stainless-steel long-path-gas-cell containing stainless-steel mirrors coated with a heavy-layer of reflective-gold over a thick-nickel substrate for chemical corrosion resistance. An electronically-operated gas handling manifold, pumping system, and computer display package are provided within a purgeable stainless-steel enclosure for user safety protection.","PeriodicalId":415720,"journal":{"name":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","volume":"266 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2000.869720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A totally integrated hardware and software gas analysis system, IRGAS/sup TM/, is newly available to the semiconductor process engineer to monitor the ppb quality level of the corrosive and toxic cleaning and etching gases in real-time and on-line with process tools in a fab plant. The IRGAS/sup TM/ system is based upon an industrial-ruggedized FTIR spectrometer coupled with a nickel-plated stainless-steel long-path-gas-cell containing stainless-steel mirrors coated with a heavy-layer of reflective-gold over a thick-nickel substrate for chemical corrosion resistance. An electronically-operated gas handling manifold, pumping system, and computer display package are provided within a purgeable stainless-steel enclosure for user safety protection.
用于快速响应,在线分析电子半导体气体中ppb杂质的交钥匙工业仪器
一个完全集成的硬件和软件气体分析系统,IRGAS/sup TM/,是最新提供给半导体工艺工程师,实时和在线监测腐蚀和有毒清洗和蚀刻气体的ppb质量水平,在晶圆厂的工艺工具。IRGAS/sup TM/系统是基于工业坚固耐用的FTIR光谱仪与镀镍不锈钢长路径气体电池相结合,该电池含有不锈钢反射镜,在厚镍衬底上涂有一层厚厚的反射金,以抵抗化学腐蚀。电子操作的气体处理歧管,泵送系统和计算机显示包内提供了一个可清洗的不锈钢外壳,以保护用户的安全。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信