{"title":"Turnkey industrial instrumentation for fast-response, on-line analysis of ppb impurities in the electronic semiconductor gases","authors":"R. Mever, J. E. Perez, S. Strickland","doi":"10.1109/LEOSST.2000.869720","DOIUrl":null,"url":null,"abstract":"A totally integrated hardware and software gas analysis system, IRGAS/sup TM/, is newly available to the semiconductor process engineer to monitor the ppb quality level of the corrosive and toxic cleaning and etching gases in real-time and on-line with process tools in a fab plant. The IRGAS/sup TM/ system is based upon an industrial-ruggedized FTIR spectrometer coupled with a nickel-plated stainless-steel long-path-gas-cell containing stainless-steel mirrors coated with a heavy-layer of reflective-gold over a thick-nickel substrate for chemical corrosion resistance. An electronically-operated gas handling manifold, pumping system, and computer display package are provided within a purgeable stainless-steel enclosure for user safety protection.","PeriodicalId":415720,"journal":{"name":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","volume":"266 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Digest of the LEOS Summer Topical Meetings. Electronic-Enhanced Optics. Optical Sensing in Semiconductor Manufacturing. Electro-Optics in Space. Broadband Optical Networks (Cat. No.00TH8497)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2000.869720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A totally integrated hardware and software gas analysis system, IRGAS/sup TM/, is newly available to the semiconductor process engineer to monitor the ppb quality level of the corrosive and toxic cleaning and etching gases in real-time and on-line with process tools in a fab plant. The IRGAS/sup TM/ system is based upon an industrial-ruggedized FTIR spectrometer coupled with a nickel-plated stainless-steel long-path-gas-cell containing stainless-steel mirrors coated with a heavy-layer of reflective-gold over a thick-nickel substrate for chemical corrosion resistance. An electronically-operated gas handling manifold, pumping system, and computer display package are provided within a purgeable stainless-steel enclosure for user safety protection.