C. Barcellona, M. Bucolo, Giovanna Stella, A. Buscarino, L. Fortuna, G. Mazzitelli, B. Esposito
{"title":"Advanced Image-Processing for the Estimation of Pitch Angle for Runaway Electrons in Tokamaks","authors":"C. Barcellona, M. Bucolo, Giovanna Stella, A. Buscarino, L. Fortuna, G. Mazzitelli, B. Esposito","doi":"10.1109/MELECON48756.2020.9140699","DOIUrl":null,"url":null,"abstract":"In a tokamak plasma, Runaway Electrons (REs) generation can occur during plasma discharges causing damages to the first wall components. One main target in the future fusion devices is the detection of REs and control of their effects. This paper presents the analysis of visible images due to synchrotron radiation emitted by runaway electrons in FTU plasmas. A platform exploiting advanced image-processing techniques for the REs pitch angle calculation is presented.","PeriodicalId":268311,"journal":{"name":"2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MELECON48756.2020.9140699","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In a tokamak plasma, Runaway Electrons (REs) generation can occur during plasma discharges causing damages to the first wall components. One main target in the future fusion devices is the detection of REs and control of their effects. This paper presents the analysis of visible images due to synchrotron radiation emitted by runaway electrons in FTU plasmas. A platform exploiting advanced image-processing techniques for the REs pitch angle calculation is presented.