Investigation of secondary electron emission suppression for TWT multistage depressed collectors

Abstract

We have built an ion treatment system for TWT multistage depressed collectors (MDCs), and investigated the process for secondary electron emission (SEE) suppression. It is found that SEE ratio for oxygen-free high-conductive copper (OFHC) plates is closely related to deposition rate of Mo and surface texture. With the optimized process, SEE ratio has been reduced to a half of the untreated (OFHC).