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Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning

Journal of Telecommunictions and Information Technology Pub Date : 2022-03-31 DOI:10.26636/jtit.2022.156321
Adriana Ganum, D. A. Iskandar, Lim Phei Chin, A. H. Fauzi
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Journal of Telecommunictions and Information Technology
Journal of Telecommunictions and Information Technology
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