Donghwan Kim, I. Park, Hyun-Ju Kang, Kyung-Hyun Kim, C. Chung
{"title":"A fast method for obtaining electron energy distribution function by using Savitzky Golay technique","authors":"Donghwan Kim, I. Park, Hyun-Ju Kang, Kyung-Hyun Kim, C. Chung","doi":"10.1109/PLASMA.2016.7534247","DOIUrl":null,"url":null,"abstract":"Summary form only given. A numerical method to obtain the electron energy distribution function (EEDF) using Savitzky-Golay technique is proposed. The Savitzky-Golay filter is one of usually adopted methods to smooth the distorted data, and also gives derivatives of data; the second derivative of I-V characteristic curve is used to obtain the EEDF. Thus, we modified the method to analyze the I-V curve by varying filter parameters, such as number of data and polynomial order. From the optimization of the filter parameters, reliable EEDFs are obtained. This method is suitable for fast measurement of the EEDF due to its simple arithmetic operation that makes the method useful in EEDF measurement using Langmuir probe with tunable external filter which needs fast refreshment of the measurement result.","PeriodicalId":424336,"journal":{"name":"2016 IEEE International Conference on Plasma Science (ICOPS)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Plasma Science (ICOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PLASMA.2016.7534247","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Summary form only given. A numerical method to obtain the electron energy distribution function (EEDF) using Savitzky-Golay technique is proposed. The Savitzky-Golay filter is one of usually adopted methods to smooth the distorted data, and also gives derivatives of data; the second derivative of I-V characteristic curve is used to obtain the EEDF. Thus, we modified the method to analyze the I-V curve by varying filter parameters, such as number of data and polynomial order. From the optimization of the filter parameters, reliable EEDFs are obtained. This method is suitable for fast measurement of the EEDF due to its simple arithmetic operation that makes the method useful in EEDF measurement using Langmuir probe with tunable external filter which needs fast refreshment of the measurement result.