A flexible simulation methodology and tool for nanoarray-based architectures

Abstract

Nanoscale arrays based on nanowires are expected to have a promising future thanks to their amazing density and regularity. Experiments demonstrated the feasibility of this technology and pointed out that accurate reliability analyses should be accomplished to assure proper yield requirements. Due to the complexity of these systems and the arising necessity of thorough fault analysis, design automation tools are mandatory in order to explore architectural solutions and fault tolerant approaches deriving information from reliable nanoarray characterisation.