Test pattern generation for combinatorial multi-valued networks based on generalized D-algorithm

Abstract

A calculus for test pattern generation for Multi-Valued Logic (MVL) networks using so-called Direct D-cubes (DD-cubes) is proposed. The concept of the DD-cubes is introduced based on Direct Logic Derivatives generated by a matrix algorithm. It provides a means to support the central stages of test generating on parallel hardware, for instance, linear systolic arrays.