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Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique

Electrical Atomic Force Microscopy for Nanoelectronics Pub Date : 2019-08-01 DOI:10.1007/978-3-030-15612-1_6
S. Martin, B. Gautier, N. Baboux, A. Gruverman, A. Carretero-Genevrier, M. Gich, A. Gómez
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Electrical Atomic Force Microscopy for Nanoelectronics
Electrical Atomic Force Microscopy for Nanoelectronics
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