Defect Analysis and Testing of Low Power Nanoscale Reversible Decoder using Quantum Dot Cellular Automata

Abstract

Article history: Received 20 April 2019 Accepted 30 April 2019 Available online 20 May 2019 The present research focusses on analysis of defects and the framework for testing the reversible decoder constructed using quantum dot cellular automata circuits. Quantum dot cellular automata has been one of the paradigms shifts from the conventional complementary metal oxide field effect transistor. This paper focuses on the modeling of struck at faults that possibly occurs in a circuit other than the fabrication defects. The struck at faults are modeled considering the inverter and the majority voter. We have also created a model for the flow of signal on the reversible decoder using quantum dot cellular automata. The design analyses the percentage of fault occurrence for the decoder constructed using reversible QCA2 Gate. The model is simulated using QCA Designer tool.