Influence of a glass properties and structural-phase transformations on electrophysical parameters of semiconductor systems “glass — Pb2Ru2O6, Ru2”

Abstract

Combined influence of glass properties, ratio of its component initial concentrations and processes of structural-phase interaction of a glass matrix with a current-carrying phase on electrophysical parameters of “glass - RuO₂, Pb₂Ru₂O₆” systems has been investigated at its annealing. It was established, that the big contents of boron oxide and high acidity of glasses - is a principal cause of chemical lead ruthenate decomposition and formation of ruthenium dioxide at heterophase system annealing. The destruction of lead ruthenate begins at concentration of acid B₂O₃ ~ 10....20%. Surface resistivity of a film decreases, as RuO₂ is characterized by higher conductivity. With increase of B₂O₃ dioxide concentration in glass the increase of conductivity begins at smaller Pb₂Ru₂O₆ concentration. Changing of ratio Pb/SiO₂ in structure of two-componental glasses results in changing of basicity, and also for reduction of the linear expansion temperature coefficient. Such changing of properties naturally influences and on resistor physical properties formation. With increase of PbO the acidity grows, what indicate that concentration of Ru₂ grows, resistance sink. Reduction of ps at increase of PbO concentration proceeds under the parabolic law with extreme value at 80 % of PbO. The further increase of ps is connected with the fact that concentration of PbO is increased due to Pb₂Ru₂O₆ decomposition. Introduction in the glass structure of bivalent metal oxides raises ps. Particularly the big influence have PbO, BaO, CaO. It is reflected in increase of ps of dielectric barriers between particles of conducting phase.