{"title":"Deep Learning in X-ray Testing","authors":"D. Mery, C. Pieringer","doi":"10.1007/978-3-030-56769-9_7","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":115667,"journal":{"name":"Computer Vision for X-Ray Testing","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Computer Vision for X-Ray Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-56769-9_7","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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