A testing instrument for dynamic contact resistance

Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458) Pub Date : 1999-06-26 DOI:10.1109/HKEDM.1999.836423

L. Wenhua, L. Zhigang

引用次数: 0

Abstract

A mathematical model of the contact resistance of electrical apparatus contacts and its dynamic changing law are discussed, and a new testing instrument for the dynamic contact process of low-capacitance contacts (mainly relay contacts) is introduced.

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一种动态接触电阻测试仪

讨论了电气设备触点接触电阻的数学模型及其动态变化规律，介绍了一种新型的小电容触点(主要是继电器触点)动态接触过程测试仪器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)

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