Charge conservative FET modelling using ANNs

Abstract

The paper presents a comprehensive charge modelling approach for field-effect transistor (FET) devices. For the first time an artificial neural network (ANN) is combined with the division-by-current approach to FET charge modelling. Using this technique a large-signal charge model is extracted for a 10 W GaN device from MACOM. It is shown through measurements that excellent results may be obtained using just a single gate charge function, integrated analytically from small-signal measurements.