Hardware implementations and performance assessments of a DC magnetron sputter for enhanced depositions

Cheng-Tsung Liu, Chih‐Wen Chang
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Abstract

To refine the substrate deposition results, some supplementary mechanical adjustments can be designed and implemented onto the existing DC magnetron sputters (MS). By the assistances of these attachments along with proper controls on the magnetic and electric field paths inside the vacuum chamber, results indicated that more target atoms can be sputtered and smoother depositions on the substrate surface can be achieved. Based on appropriate performance index selections, operations of the DC MS were thoroughly investigated. Selected regions on the deposited substrate surface will be probed with thickness gauge and atomic force microscopy, thus the operational performances of the DC MS with structural refinements can be assessed and the desired improvements can then be systematically validated.
用于增强沉积的直流磁控溅射的硬件实现和性能评估
为了改善衬底沉积结果,可以在现有的直流磁控溅射(MS)上设计和实施一些补充的机械调节。结果表明,在真空腔内适当控制磁场路径和电场路径的辅助下,可以溅射更多的靶原子,并且可以在衬底表面实现更光滑的沉积。在选择合适的性能指标的基础上,深入研究了直流质谱的运行情况。将使用厚度计和原子力显微镜探测沉积基板表面的选定区域,从而可以评估具有结构改进的直流质谱的操作性能,然后可以系统地验证所需的改进。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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