{"title":"Susceptibility of notebook computers to HPM","authors":"Y. Murata, T. Hoshina, Yoshifumi Hatori","doi":"10.1109/ISEMC.2014.6899032","DOIUrl":null,"url":null,"abstract":"In this paper, we evaluate the susceptibility of notebook computers to high power microwave (HPM) pulses. We have developed a HPM test instrument with stripline structure. The structures of the test instrument are investigated through finite-difference time domain (FDTD) analysis to get homogeneous electromagnetic fields inside the instrument. The developed instrument can apply a 2.7 kV/m electric field below 3 GHz with using a 100 W power amplifier. The stripline instrument is an open structure, which can easily apply electric fields to a specific part of notebook computers. The HPM pulses were applied to the main body of notebook computers. We obtained the frequencies of the HPM pulses at which the notebook computer operation has failed. Radiated susceptibility tests were also carried out on notebook computers with an antenna. The computer failure frequencies of the test instrument agree with the failure frequencies from observed during the radiated susceptibility test. Our test instrument is useful for preliminary test of notebook computers and for investigating the effective HPM pulse condition.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2014.6899032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
In this paper, we evaluate the susceptibility of notebook computers to high power microwave (HPM) pulses. We have developed a HPM test instrument with stripline structure. The structures of the test instrument are investigated through finite-difference time domain (FDTD) analysis to get homogeneous electromagnetic fields inside the instrument. The developed instrument can apply a 2.7 kV/m electric field below 3 GHz with using a 100 W power amplifier. The stripline instrument is an open structure, which can easily apply electric fields to a specific part of notebook computers. The HPM pulses were applied to the main body of notebook computers. We obtained the frequencies of the HPM pulses at which the notebook computer operation has failed. Radiated susceptibility tests were also carried out on notebook computers with an antenna. The computer failure frequencies of the test instrument agree with the failure frequencies from observed during the radiated susceptibility test. Our test instrument is useful for preliminary test of notebook computers and for investigating the effective HPM pulse condition.