HIGH RESOLUTION REFLECTOMETRY AT SINGAPORE SYNCHROTRON LIGHT SOURCE

Abstract

X-ray reflectometry (XRR) at Singapore Synchrotron Light Source (SSLS) is reviewed. The instrument and methods are introduced. Two films made of a poly-(styrene-block-2-vinylpyridine) diblock copolymer (PS-b-P2VP) film template and indium-tin-oxide (ITO, In2-xSnxO3-2x) are shown as typical applications of XRR. A simulation for spin valve magnetic sandwich layers is also shown as an application of anomalous scattering effect to XRR.