A Fitting Model for High Current Density Field Emission Arrays

Ming-Chieh Lin
{"title":"A Fitting Model for High Current Density Field Emission Arrays","authors":"Ming-Chieh Lin","doi":"10.1109/IVELEC.2007.4283344","DOIUrl":null,"url":null,"abstract":"We have developed a new method for fitting the current-voltage (I-V) characteristics of the field emission arrays (FEAs) that may be operated at high current density. The self-consistent model is demonstrated to be a good fit to the I-V characteristics of high current density FEAs. This also indicates that the space charge effects play an essential role in the saturation behaviour of FEAs.","PeriodicalId":254940,"journal":{"name":"2007 IEEE International Vacuum Electronics Conference","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVELEC.2007.4283344","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

We have developed a new method for fitting the current-voltage (I-V) characteristics of the field emission arrays (FEAs) that may be operated at high current density. The self-consistent model is demonstrated to be a good fit to the I-V characteristics of high current density FEAs. This also indicates that the space charge effects play an essential role in the saturation behaviour of FEAs.
高电流密度场发射阵列的拟合模型
我们开发了一种新的方法来拟合可能在大电流密度下工作的场发射阵列(FEAs)的电流-电压(I-V)特性。结果表明,自洽模型能很好地拟合高电流密度有限元的I-V特性。这也表明空间电荷效应在FEAs的饱和行为中起着重要的作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信