Nondestructive measurement for multilayer inhomogeneous material based on multiresolution analysis

Abstract

In this paper, a new and effective method based on multiresolution analysis (wavelet analysis) is proposed. It is used to nondestructively reconstruct the depth distribution of optical-absorption coefficient in multilayer inhomogeneous material with the photothermal signals which are related to the surface temperature of a sample. Numerical simulations and experimental data show that this method is feasible and the performance of the approach is better.