{"title":"Automated Tool for Revising Masking MC/DC Test Suite","authors":"Zhenxiang Chen, H. Washizaki, Y. Fukazawa","doi":"10.1109/ISSREW51248.2020.00060","DOIUrl":null,"url":null,"abstract":"Modified Condition and Decision Coverage (MC/DC) is a software testing criterion to check code coverage. It can be divided into a unique-cause MC/DC and masking MC/DC, according to the level of acceptance in concepts. Although masking MC/DC is used in many applications, in our study we found undetectable cases utilizing Masking MC/DC test suites that could be detected using stricter unique-cause MC/DC. To ensure the strictness of MC/DC criterion, herein we propose an automated tool that revises the masking MC/DC test suite into a unique-cause MC/DC.","PeriodicalId":202247,"journal":{"name":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSREW51248.2020.00060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Modified Condition and Decision Coverage (MC/DC) is a software testing criterion to check code coverage. It can be divided into a unique-cause MC/DC and masking MC/DC, according to the level of acceptance in concepts. Although masking MC/DC is used in many applications, in our study we found undetectable cases utilizing Masking MC/DC test suites that could be detected using stricter unique-cause MC/DC. To ensure the strictness of MC/DC criterion, herein we propose an automated tool that revises the masking MC/DC test suite into a unique-cause MC/DC.