Pseudorandom versus deterministic testing of Intel 80/spl times/86 processors

Abstract

The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.