A Hybrid Atomistic - Semi-Analytical Modeling on Schottky Barrier Au-MoS2-Au MOSFETs

A. Mukhopadhyay, S. Bhattacharya, P. Gupta, L. Banerjee, A. Sengupta, H. Rahaman
{"title":"A Hybrid Atomistic - Semi-Analytical Modeling on Schottky Barrier Au-MoS2-Au MOSFETs","authors":"A. Mukhopadhyay, S. Bhattacharya, P. Gupta, L. Banerjee, A. Sengupta, H. Rahaman","doi":"10.1109/EDKCON.2018.8770224","DOIUrl":null,"url":null,"abstract":"In this work, we investigate the layer dependency of Mos2channel material based Double Gate Schottky barrier MOSFET. In order to evaluate the transport properties due to this effect accurately, we have calculated the electronic properties of multilayer Mos2using density functional theory and incorporated those parameters in our analytical model for double Gate Schottky barrier MOSFET. A full description of the electron transport due to tunneling through the Schottky barrier and thermionic emission of electrons is computed in our model. Our results demonstrate that monolayer Mos2shows good device characteristics for logic applications, with ON/OFF ratio $\\sim 10^{7}$. As far as the layer dependency is concerned, more than two times higher drain current is achievable for the device made of the monolayer based channel than that of the five-layer based channel of Mos2. In Mos2, drive current, transconductance significantly reduced with increasing number of layer. The results obtained with our model concur with experimental reports.","PeriodicalId":344143,"journal":{"name":"2018 IEEE Electron Devices Kolkata Conference (EDKCON)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Electron Devices Kolkata Conference (EDKCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDKCON.2018.8770224","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

In this work, we investigate the layer dependency of Mos2channel material based Double Gate Schottky barrier MOSFET. In order to evaluate the transport properties due to this effect accurately, we have calculated the electronic properties of multilayer Mos2using density functional theory and incorporated those parameters in our analytical model for double Gate Schottky barrier MOSFET. A full description of the electron transport due to tunneling through the Schottky barrier and thermionic emission of electrons is computed in our model. Our results demonstrate that monolayer Mos2shows good device characteristics for logic applications, with ON/OFF ratio $\sim 10^{7}$. As far as the layer dependency is concerned, more than two times higher drain current is achievable for the device made of the monolayer based channel than that of the five-layer based channel of Mos2. In Mos2, drive current, transconductance significantly reduced with increasing number of layer. The results obtained with our model concur with experimental reports.
肖特基势垒Au-MoS2-Au mosfet的混合原子-半解析模型
在这项工作中,我们研究了基于mos2沟道材料的双栅肖特基势垒MOSFET的层依赖性。为了准确地评估由于这种效应引起的输运特性,我们利用密度泛函理论计算了多层mos2的电子特性,并将这些参数纳入我们的双栅肖特基势垒MOSFET的分析模型中。在我们的模型中计算了通过肖特基势垒隧穿和电子热离子发射的电子传输的完整描述。我们的研究结果表明,单层mos2在逻辑应用中具有良好的器件特性,其开/关比为$\sim 10^{7}$。就层依赖性而言,由单层沟道制成的器件可以实现比基于Mos2的五层沟道高两倍以上的漏极电流。在Mos2中,随着层数的增加,驱动电流、跨导显著减小。用我们的模型得到的结果与实验报告一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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