Rui Tze Toh, Shyam Parthasarathy, T. Sun, Shaoqiang Zhang, Raj Verma Purakh, Chao Song Zhu, Venkata Sudheer Nune, J. S. Wong, M. Govindarajan, Y. K. Yoo, K. Chew, D. Ang
{"title":"A 300mm foundry HRSOI technology with variable silicon thickness for integrated FEM applications","authors":"Rui Tze Toh, Shyam Parthasarathy, T. Sun, Shaoqiang Zhang, Raj Verma Purakh, Chao Song Zhu, Venkata Sudheer Nune, J. S. Wong, M. Govindarajan, Y. K. Yoo, K. Chew, D. Ang","doi":"10.1109/IEDM.2016.7838031","DOIUrl":null,"url":null,"abstract":"A novel approach to technology integration of system-on-chip RF Front-End Module (FEM) is presented. Device design to achieve best-in-class extended drain power mosfet (EDNMOS) with Ron of 1.6Ohm-mm and fT >39GHz is discussed. This is followed by an analysis of a high performance switch device integrated via selective silicon thinning.","PeriodicalId":186544,"journal":{"name":"2016 IEEE International Electron Devices Meeting (IEDM)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2016.7838031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A novel approach to technology integration of system-on-chip RF Front-End Module (FEM) is presented. Device design to achieve best-in-class extended drain power mosfet (EDNMOS) with Ron of 1.6Ohm-mm and fT >39GHz is discussed. This is followed by an analysis of a high performance switch device integrated via selective silicon thinning.