An equivalent circuit perturbation method for machining deviation and yield analysis of Substrate Integrated Waveguide filters

Abstract

Substrate Integrated Waveguide (SIW) will play an important role in mass production of millimeter-wave systems due to the low-cost, mass-producible, compact characteristic and easy to integrate with other planar circuits. It is necessary to estimate the fabrication yield in mass production. However, yield analysis is an impracticable task for the full-wave simulation method due to large computational amount. This paper proposed an equivalent circuit perturbation method for rectangular SIW-cavity filters to achieve fast and accurate analysis of SIW filter with machining deviations. Based upon the Monte Carlo experiments, this method is applied to estimate the fabrication yield of a four square-cavity SIW filter at 28GHz. Moreover, measurements are carried out to obtain the actual performance of filters fabricated with standard PCB process.