Advanced flip chip encapsulation: transfer molding process for simultaneous underfilling and postencapsulation

K. Becker, T. Braun, M. Koch, F. Ansorge, R. Aschenbrenner, H. Reichl
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引用次数: 5

Abstract

The process development for four flip chip molding compounds was based on material characterization by DSC, DMA and TMA. It was shown that the materials tested do allow reliable flip chip molding. Materials properties concerning processability and reliability are promising. There is strong potential of the technology for the increasing market of flip chip packages as certain types of BGA's and, with further miniaturization, CSP's. As these packages incorporate typically single dies, the transfer mold process can be adapted without major changes to existing equipment. Even for future developments such as one chip flip chip SIP's using advanced IC thinning and assembly methods, the flip chip molding underfill process is a successful vision for reliable encapsulation.
先进的倒装芯片封装:传递成型工艺,同时下填充和后封装
在DSC、DMA和TMA表征材料的基础上,开发了四种倒装成型化合物的工艺。结果表明,所测试的材料确实允许可靠的倒装芯片成型。材料的可加工性和可靠性是有前景的。对于某些类型的BGA和进一步小型化的CSP,倒装芯片封装市场的增长,该技术具有强大的潜力。由于这些包装通常包含单个模具,因此转移模具过程可以在不对现有设备进行重大更改的情况下进行调整。即使对于未来的发展,例如使用先进IC减薄和组装方法的单芯片倒装芯片SIP,倒装芯片成型下填充工艺也是可靠封装的成功愿景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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