{"title":"High power microwave measurement techniques at CEA-Gramat","authors":"A. Chauloux, J. Diot, N. Tharaud, Jérémy Pothée","doi":"10.1109/IVEC45766.2020.9520472","DOIUrl":null,"url":null,"abstract":"High power microwave (HPM) measurement remains a challenging application since it requires accurate sensors with high power handling. Electromagnetic (EM) fields can reach dramatically high magnitudes such as MV per meter. If no particular attention is paid when designing a sensor for HPM measurements, electrical breakdowns may appear. This leads to irreversible damages and non-accurate results. Through the HPM developments achieved at CEA-Gramat various techniques have raised for the diagnostic of EM fields patterns and microwave power levels delivered by relativistic sources. Three are here introduced: EM field measurement with in-situ calibration; a waveguide integrated coupler to determine output powers of microwave sources; a photothermal film to observe the EM field.","PeriodicalId":170853,"journal":{"name":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC45766.2020.9520472","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
High power microwave (HPM) measurement remains a challenging application since it requires accurate sensors with high power handling. Electromagnetic (EM) fields can reach dramatically high magnitudes such as MV per meter. If no particular attention is paid when designing a sensor for HPM measurements, electrical breakdowns may appear. This leads to irreversible damages and non-accurate results. Through the HPM developments achieved at CEA-Gramat various techniques have raised for the diagnostic of EM fields patterns and microwave power levels delivered by relativistic sources. Three are here introduced: EM field measurement with in-situ calibration; a waveguide integrated coupler to determine output powers of microwave sources; a photothermal film to observe the EM field.