{"title":"Study of Relations between Several Factors in Immersion Silver Technique and Galvanic Attack Problem","authors":"Kun Li, D. Xiang, X. Liu","doi":"10.1109/ISEE.2007.369394","DOIUrl":null,"url":null,"abstract":"To control lead pollution,\" Hot Air Solder Leveling \"(HASL), the traditional lead-contained PCB(Printed Circuit Board) surface finish, needs to be replaced by lead- free technique. Immersion Silver (I-Ag) has many merits compared to other lead-free techniques, thereby being increasingly widely used. However, a problem named \"galvanic attack\", which seriously erodes copper where circuit connects pad, is a serious obstacle to I-Ag's popularization. According to manufacturing experience, consistency of silver ion, temperature, mircoetch rate and liquid level are four major factors in I-Ag process. In this paper, relations between these factors and galvanic attack are studied by experiments. From these relations we get inspirations to reduce galvanic attack in engineering practice.","PeriodicalId":275164,"journal":{"name":"Proceedings of the 2007 IEEE International Symposium on Electronics and the Environment","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2007 IEEE International Symposium on Electronics and the Environment","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEE.2007.369394","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
To control lead pollution," Hot Air Solder Leveling "(HASL), the traditional lead-contained PCB(Printed Circuit Board) surface finish, needs to be replaced by lead- free technique. Immersion Silver (I-Ag) has many merits compared to other lead-free techniques, thereby being increasingly widely used. However, a problem named "galvanic attack", which seriously erodes copper where circuit connects pad, is a serious obstacle to I-Ag's popularization. According to manufacturing experience, consistency of silver ion, temperature, mircoetch rate and liquid level are four major factors in I-Ag process. In this paper, relations between these factors and galvanic attack are studied by experiments. From these relations we get inspirations to reduce galvanic attack in engineering practice.