A novel approach to perform circuit verification using spans

R.B. Nunes, C.E.T. Oliveira, M. L. Anido
{"title":"A novel approach to perform circuit verification using spans","authors":"R.B. Nunes, C.E.T. Oliveira, M. L. Anido","doi":"10.1109/MWSCAS.1995.504445","DOIUrl":null,"url":null,"abstract":"This paper presents a novel approach to perform circuit verification, particularly Design Rule Checking (DRC), using a data structure based on maximally-horizontal layout regions termed spans. The paper also discusses the characteristics required by a data structure to properly support different tasks such as graphics editing, design rule checking and circuit extraction. Most of the basic and primitive operations, necessary to support design rule checking on a circuit using a layout representation based on spans, are presented and special attention is paid to the solution of the difficult test of 45 degrees width (and also spacing) violation.","PeriodicalId":165081,"journal":{"name":"38th Midwest Symposium on Circuits and Systems. Proceedings","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"38th Midwest Symposium on Circuits and Systems. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.1995.504445","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper presents a novel approach to perform circuit verification, particularly Design Rule Checking (DRC), using a data structure based on maximally-horizontal layout regions termed spans. The paper also discusses the characteristics required by a data structure to properly support different tasks such as graphics editing, design rule checking and circuit extraction. Most of the basic and primitive operations, necessary to support design rule checking on a circuit using a layout representation based on spans, are presented and special attention is paid to the solution of the difficult test of 45 degrees width (and also spacing) violation.
一种利用跨度进行电路验证的新方法
本文提出了一种新的方法来执行电路验证,特别是设计规则检查(DRC),使用基于最大水平布局区域称为跨度的数据结构。本文还讨论了数据结构为支持图形编辑、设计规则检查和电路提取等不同任务所需要的特性。给出了支持使用基于跨度的布局表示对电路进行设计规则检查所必需的大多数基本和原始操作,并特别注意了45度宽度(以及间距)违反的困难测试的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信