Validation Methods For Reflection Factor High Frequency

N. Fezai, Abdessattar Ben Amor
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引用次数: 1

Abstract

Network analysis is the method by which manufacturers and designers measure the electrical performance of components and circuits used in more complex systems. When these systems are transmitting signals with information content, we are most concerned with getting the signal from one point to another with minimum distortion and maximum efficiency. Vector network analysis is a method of accurately characterizing such components by measuring their effect on the amplitude and phase of swept-frequency and swept-power test signals. In the field of the measurement of S-parameters using a vector network analyzer, the pertinent question is how to calibrate this measuring device high frequency. In fact, calibration is defined by ISO/CEI 17025 “…set of operations that establish, under specified conditions, the relationship between values of quantities indicated by a measuring instrument or measuring system, or values represented by a material measure or a reference material, and the corresponding values realized by standards.”[1] Indeed, calibration is critical to making good VNA S-parameter measurements by given the matrix and complex nature of the measurand, the frequency range and the range of the potentially measured values. While the VNA is a highly-linear receiver and has sufficient spectral purity in its sources to make good measurements, calibration is not directly feasible then we use the notion of calibration, which is to automatically correct the measurement errors. This calibration then allows resetting the response of the instrument to a true predicted value calculated from the measured raw value and the error coefficients determined by the calibration. This correction made to the meter can then be seen as an improvement in its accuracy. So, the calibration of VNA is a validation method to insure the Traceability to SI according to the parameter reflection factor. The topic of this paper is to present a method of calibration of VNA "1- PORT" in order to quantify the terms of errors systematic and validate the primary method “compensated reflectometer” , enrich the park of calibration methods and to meet requirements of ISO / IEC 17025 (Part7.2.2 validation of methods) [1].
高频反射系数的验证方法
网络分析是制造商和设计师用来测量更复杂系统中使用的元件和电路的电气性能的方法。当这些系统传输具有信息内容的信号时,我们最关心的是如何以最小的失真和最大的效率将信号从一个点传输到另一个点。矢量网络分析是一种通过测量其对扫描频率和扫描功率测试信号的幅度和相位的影响来准确表征这些分量的方法。在矢量网络分析仪s参数测量领域中,如何对该测量装置进行高频标定是一个相关的问题。事实上,校准是由ISO/CEI 17025定义的“……在规定条件下,建立测量仪器或测量系统所指示的量的值,或由物质测量或参考物质所表示的值与标准实现的相应值之间的关系的一组操作。”[1]事实上,在给定测量矩阵和复杂性质、频率范围和潜在测量值范围的情况下,校准对于进行良好的VNA s参数测量至关重要。虽然VNA是一个高度线性的接收器,并且在其源中具有足够的光谱纯度来进行良好的测量,但校准不是直接可行的,因此我们使用校准的概念,即自动校正测量误差。然后,该校准允许将仪器的响应重置为根据测量的原始值和校准确定的误差系数计算的真实预测值。这种对仪表的修正可以看作是其精度的提高。因此,根据参数反射系数对VNA进行标定是一种保证对SI可追溯性的验证方法。本文的主题是提出一种VNA“1- PORT”的校准方法,以系统地量化误差项并验证主要方法“补偿反射计”,丰富校准方法的范围,并满足ISO / IEC 17025 (Part7.2.2方法验证)的要求[1]。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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