{"title":"Heat flow in SOI current mirrors","authors":"F. Yu, M. Cheng","doi":"10.1109/ISDRS.2003.1272150","DOIUrl":null,"url":null,"abstract":"An analytical heat flow model, accounting for heat exchanges among devices via interconnect/poly lines and heat loss to oxide is developed and applied to study heat flow in SOI current mirror structures. An SOI nMOS current mirror illustrates the thermal coupling and heat flow through the interconnect. The interconnect provides an efficient heat loss medium for the SOI circuit.","PeriodicalId":369241,"journal":{"name":"International Semiconductor Device Research Symposium, 2003","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Semiconductor Device Research Symposium, 2003","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISDRS.2003.1272150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
An analytical heat flow model, accounting for heat exchanges among devices via interconnect/poly lines and heat loss to oxide is developed and applied to study heat flow in SOI current mirror structures. An SOI nMOS current mirror illustrates the thermal coupling and heat flow through the interconnect. The interconnect provides an efficient heat loss medium for the SOI circuit.