M. Mazumder, R. Bohnke, A. Husain, D. Grannes, E. Chiprout, Lei Sun, S. Menon, J. Eells, C. Dai
{"title":"An efficient pre-layout on-chip inductance noise modeling tool for bus design","authors":"M. Mazumder, R. Bohnke, A. Husain, D. Grannes, E. Chiprout, Lei Sun, S. Menon, J. Eells, C. Dai","doi":"10.1109/EPEP.2003.1250058","DOIUrl":null,"url":null,"abstract":"On-chip inductance noise is becoming an increasingly important part of the total noise, particularly for global on-chip interconnects, because of faster transistor speeds and higher drive currents. An efficient pre-layout tool has been developed for accurate analysis of high frequency inductance effects on bus design. Since the return loop for inductance is not known a priori, a novel technique has been developed for fast determination of the inductance extraction window size to include all significant couplings and a sufficient number of power/ground return conductors. In addition, an algorithm has been developed for worst-case vector generation to estimate worst-case peak noise. The tool includes a methodology to determine the impact of power supply noise on bus crosstalk noise. It integrates RLC extraction, netlist generation, automatic worst-case vector generation, transient simulation, optimization, and post-processing of the simulated results to calculate noise, delay, and other signal integrity metrics. We demonstrate its application on optimal bus design by a microprocessor design group.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1250058","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
On-chip inductance noise is becoming an increasingly important part of the total noise, particularly for global on-chip interconnects, because of faster transistor speeds and higher drive currents. An efficient pre-layout tool has been developed for accurate analysis of high frequency inductance effects on bus design. Since the return loop for inductance is not known a priori, a novel technique has been developed for fast determination of the inductance extraction window size to include all significant couplings and a sufficient number of power/ground return conductors. In addition, an algorithm has been developed for worst-case vector generation to estimate worst-case peak noise. The tool includes a methodology to determine the impact of power supply noise on bus crosstalk noise. It integrates RLC extraction, netlist generation, automatic worst-case vector generation, transient simulation, optimization, and post-processing of the simulated results to calculate noise, delay, and other signal integrity metrics. We demonstrate its application on optimal bus design by a microprocessor design group.