A test platform implementing SPC in a low-volume, high-mix test department

D. L. Stanley, R.F. Duncan, G.W. Smith
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Abstract

The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failures and troubleshooting activities and increase test efficiency with minimal test development costs. A common test platform has been developed that can be configured to test a wide variety of sub-assemblies from digital controller cards to radio frequency (RF) modules. The platform consists of a PC with a multi-function data acquisition card and a General Purpose Interface Bus (GPIB) card for control of test instruments. Applications are linked with Dynamic Data Exchange (DDE) and the PCs are connected to the company's Local Area Network (LAN) so that test data can be accessed from throughout the plant. A key point is the implementation of SPC with this test platform. Statistics include process capability indices C/sub p/ and C/sub pk/ and failure rate. Test data is analyzed and used to make process improvements. Examples are presented. Since the entire system has been designed and built around established COTS software and hardware, additional capabilities can be easily added in the future. Some planned enhancements are described.
介绍了基于pc机的功能测试平台的开发,该平台结合了统计过程控制(SPC)和故障分析数据库。有了商用现成的(COTS)工具,在低容量、高混合的环境中,可以很容易地获得每个测试的基本统计信息,开发一个容易访问的故障信息数据库,故障原因和故障排除活动,并以最小的测试开发成本提高测试效率。已经开发了一个通用测试平台,可以配置为测试从数字控制卡到射频(RF)模块的各种子组件。该平台由带有多功能数据采集卡的PC机和用于控制测试仪器的通用接口总线(GPIB)卡组成。应用程序与动态数据交换(DDE)连接,pc机连接到公司的局域网(LAN),以便可以从整个工厂访问测试数据。关键是在该测试平台上实现SPC。统计包括工艺能力指标C/sub p/和C/sub pk/和故障率。对测试数据进行分析并用于工艺改进。给出了实例。由于整个系统是围绕已建立的COTS软件和硬件设计和构建的,因此将来可以很容易地添加额外的功能。描述了一些计划中的增强。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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