Acoustic detection of cracks and delamination in Multilayer Ceramic Capacitors

Saku Levikari, T. Kärkkäinen, Periti Silventoinen, C. Andersson, Juha Tamminen
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引用次数: 11

Abstract

Multilayer Ceramic Capacitors (MLCC) are the most widely used capacitor type in the electronics industry. However, the brittle ceramic dielectric makes MLCCs prone to mechanical damage. Manufacturing defects or damage during board assembly may cause a capacitor to prematurely fail during its operational life. Here, we demonstrate fast and non-destructive acoustic screening of MLCCs. Soldered 2220-sized MLCCs were subjected to AC voltage frequency sweeps, causing them to vibrate mechanically. Acoustic responses of the capacitors were measured before and after subjecting the test circuit board to severe bending. The results show that cracks and delaminations caused by bending induce characteristic changes in the capacitors' acoustic response.
多层陶瓷电容器裂纹和分层的声学检测
多层陶瓷电容器(MLCC)是电子工业中应用最广泛的电容器类型。然而,脆性陶瓷介质使得mlcc容易发生机械损伤。电路板组装过程中的制造缺陷或损坏可能导致电容器在其使用寿命期间过早失效。在这里,我们展示了mlcc的快速和非破坏性声学筛选。焊接的2220尺寸mlcc受到交流电压频率扫描,导致它们机械振动。在测试电路板剧烈弯曲前后,测量了电容器的声学响应。结果表明,弯曲引起的裂纹和分层会引起电容器声响应的特性变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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