Bayesian assessment method of device-level electromagnetic pulse effect based on Markov Chain Monte Carlo

Abstract

To assess the susceptibility of device under electromagnetic pulse (EMP) environment, simulation test is believed as an effective method. But during simulation tests, few data can be obtained to assess effect. This paper presents an effect threshold model of a communication device based on Bayesian method. The model parameters are optimized by Markov Chain Monte Carlo (MCMC) algorithm.