An extended CAD methodology for sizing low-power low-voltage OTA architectures in decananometric technologies

G. Gosset, D. Flandre, D. Flandre
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Abstract

This paper presents an extended CAD tool compatible with decananometric technologies for sizing OTA architectures. This is based on an extension of the gm/I methodology which uses, as inputs, parameters directly extracted from foundry models and can hence be easily ported to different technologies. This tool was developed in order to fasten and automate design for each OTA architecture. From fixed power consumption, the gain (Av), gain-bandwidth product (GBW), and unity gain frequency (fT) are compared among the analyzed performances. Examples are given in a bulk CMOS 65nm technology.
一种扩展的CAD方法,用于确定decananometric技术中低功耗低电压OTA架构的尺寸
本文提出了一种扩展的CAD工具,该工具与用于确定OTA体系结构大小的计量技术兼容。这是基于gm/I方法的扩展,该方法使用直接从铸造模型中提取的参数作为输入,因此可以很容易地移植到不同的技术中。开发该工具是为了使每个OTA体系结构的设计更加紧凑和自动化。从固定功耗出发,比较了增益(Av)、增益-带宽积(GBW)和单位增益频率(fT)的性能。以CMOS 65nm工艺为例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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