{"title":"A 16 Bit Self-Testing Multiplier","authors":"J. Rainard, Y. Vernay","doi":"10.1109/ESSCIRC.1980.5468773","DOIUrl":null,"url":null,"abstract":"A single chip integrated multiplier working on 16 bit words dotted with two different operating modes (serial or parallel) and able to signal out any failure by means of an internal supervision system (for some 25% extra silicon area).","PeriodicalId":168272,"journal":{"name":"ESSCIRC 80: 6th European Solid State Circuits Conference","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 80: 6th European Solid State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1980.5468773","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A single chip integrated multiplier working on 16 bit words dotted with two different operating modes (serial or parallel) and able to signal out any failure by means of an internal supervision system (for some 25% extra silicon area).