Optical constant and thickness determination using THz time-domain reflection-only signals

Abstract

A self-calibration noniterative technique for determination of the optical constants and thickness of lossless materials using only three reflection measurements is proposed. A generalized model is derived based on the reflection measurements. For validation, two different samples (Si and GaAs samples) are considered for extraction of their optical parameters and thicknesses by using a numerical full wave electromagnetic simulator. It is demonstrated that the proposed method can retrieve highly accurate results provided that reflected signal components are accurately separated.