Karen Thangam Jacob, K. G. Ganesh Kumar, B. Manjurathi
{"title":"Selective compression technique using Variable-to-Fixed coding","authors":"Karen Thangam Jacob, K. G. Ganesh Kumar, B. Manjurathi","doi":"10.1109/ICCSP.2014.6950000","DOIUrl":null,"url":null,"abstract":"Inthis paper, we propose a code based technique, Variable-to-Fixed (V-F) coding, for power efficient test data compression. The proposed scheme with the aim of achieving high compression ratio and low power consumption relies on reducing, the number of bits for representing the original test vector and the number of transitions per second. Simulation results on ISCAS'89 benchmark circuits, demonstrate that this optimization methodology helps achieve reduced test data volume than previous schemes for cases where the number of specified bits in the test set is relatively few.","PeriodicalId":149965,"journal":{"name":"2014 International Conference on Communication and Signal Processing","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Conference on Communication and Signal Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCSP.2014.6950000","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Inthis paper, we propose a code based technique, Variable-to-Fixed (V-F) coding, for power efficient test data compression. The proposed scheme with the aim of achieving high compression ratio and low power consumption relies on reducing, the number of bits for representing the original test vector and the number of transitions per second. Simulation results on ISCAS'89 benchmark circuits, demonstrate that this optimization methodology helps achieve reduced test data volume than previous schemes for cases where the number of specified bits in the test set is relatively few.