Half frequency instability on a 1W bipolar part

A. Aimdilokwong, R. Weber
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Abstract

Half frequency instability is investigated on a 1W bipolar part. The small signal scattering parameters are measured at 500 MHz while the bipolar part is operating at 1 GHz. The measurement is done over various drive levels ranging from linear to saturation regions of operation. An algorithm is used to calculate the small signal S-parameters at 500 MHz without having to present 50-ohm termination to the device but instead the optimum load at 1 GHz. This is significant because the microwave power transistor needs a suitable load termination (not a 50-ohm termination) in order to operate at that large signal level.
1W双极部分的半频不稳定性
研究了1W双极器件的半频不稳定性。当双极部分工作在1ghz时,小信号散射参数在500mhz下测量。测量完成在各种驱动水平,从线性到饱和区域的操作。使用一种算法来计算500 MHz时的小信号s参数,而不必向设备提供50欧姆的终端,而是在1 GHz时的最佳负载。这是很重要的,因为微波功率晶体管需要一个合适的负载终端(不是50欧姆终端),以便在大信号电平下工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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