{"title":"Experimental study of simultaneous measuring of film Young’s modulus and adhesion by the Non-destructive CZM-SAW technique","authors":"Haiyang Qi, Xia Xiao, Huiquan Qin, T. Kikkawa","doi":"10.1109/ISNE.2019.8896539","DOIUrl":null,"url":null,"abstract":"The surface acoustic wave (SAW) technique is valuable to determine the property of thin film because it requires only elastic deformation. It features non-destructive measurement, easy operation, time-saving and isolates substrate coupling. In the recent study, the surface acoustic wave technique with cohesive zone model (CZM-SAW) is proposed to measure the film Young’s modulus and adhesion simultaneously. In this study, the simultaneous CZM-SAW technique is further studied by the experimental study. The experimental results show that for the film with bad adhesion property and porous low-k film with lower Young’s modulus, for the reliability of measuring results, it is highly required to use simultaneous CZM-SAW technique to measure the film Young’s modulus and adhesion. Moreover, the film test results are compared with nano-indentation test and nano-scratch test. By comparison, the unique advantages of the CZM-SAW technique are well demonstrated.","PeriodicalId":405565,"journal":{"name":"2019 8th International Symposium on Next Generation Electronics (ISNE)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 8th International Symposium on Next Generation Electronics (ISNE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISNE.2019.8896539","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The surface acoustic wave (SAW) technique is valuable to determine the property of thin film because it requires only elastic deformation. It features non-destructive measurement, easy operation, time-saving and isolates substrate coupling. In the recent study, the surface acoustic wave technique with cohesive zone model (CZM-SAW) is proposed to measure the film Young’s modulus and adhesion simultaneously. In this study, the simultaneous CZM-SAW technique is further studied by the experimental study. The experimental results show that for the film with bad adhesion property and porous low-k film with lower Young’s modulus, for the reliability of measuring results, it is highly required to use simultaneous CZM-SAW technique to measure the film Young’s modulus and adhesion. Moreover, the film test results are compared with nano-indentation test and nano-scratch test. By comparison, the unique advantages of the CZM-SAW technique are well demonstrated.