V. Sodan, S. Stoffels, H. Oprins, M. Baelmans, S. Decoutere, I. De Wolf
{"title":"Distributed electro-thermal model based on fast and scalable algorithm for GaN power devices and circuit simulations","authors":"V. Sodan, S. Stoffels, H. Oprins, M. Baelmans, S. Decoutere, I. De Wolf","doi":"10.23919/ISPSD.2017.7988948","DOIUrl":null,"url":null,"abstract":"In this work, we present a novel concept of electro-thermal modelling of GaN lateral power devices. Based on a distributed modelling approach, where a thermal model and electrical compact model are coupled, a new distributed electro-thermal model has been developed. The model provides a detailed insight in the distributed electro-thermal behaviour during steady-state and transient (power switching) regime with a significant reduction of computational time compared to alternative models existing in literature. The model has been validated with experiments where p-GaN devices are tested under standard switching conditions. The waveforms and temperature readings predicted by the model show an excellent agreement with the experiments.","PeriodicalId":202561,"journal":{"name":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISPSD.2017.7988948","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this work, we present a novel concept of electro-thermal modelling of GaN lateral power devices. Based on a distributed modelling approach, where a thermal model and electrical compact model are coupled, a new distributed electro-thermal model has been developed. The model provides a detailed insight in the distributed electro-thermal behaviour during steady-state and transient (power switching) regime with a significant reduction of computational time compared to alternative models existing in literature. The model has been validated with experiments where p-GaN devices are tested under standard switching conditions. The waveforms and temperature readings predicted by the model show an excellent agreement with the experiments.