Predicted radiated emissions of systems according to the EMC standards with a time-domain EMI measurement system

S. Braun, P. Russer
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Abstract

Measurements for full compliance tests according to the EMC standards FCC, CISPR and MIL have to be performed with EMI-Receivers that must show the behavior as given in the standards. In order to predict the electromagnetic interference of a system field simulations are performed in frequencyand time-domain. Today complex systems like computer mainboards or automotive systems consist of various components that show a emission that could be described by statistical models. We have presented a Time-domain EMI (TDEMI) Measurement System that observes the input signal and generates a statistical model. This model is used to obtain a spectrum that can be evaluated under the various detector modes of an EMI Receiver. The TDEMI System reduces the measurement time by about a factor of 50. In this paper it is shown that the Time-domain EMI Measurement system allows to predict electromagnetic interference of a system consisting of several characterized components. A statistical model of the emission of each source and a model of coupling is used to obtain a statistical model that describes the complete system. The statistical model of the emission of a single source can be obtained by measurements or system level simulations. The coupling model is obtained by field solving tools. The resulting statistical model of the complete system is used to obtain a spectrum that can be evaluated under peak, quasi-peak, average and rms detector. Measurements have been performed with drill machine and a laptop as an example of a system consisting of two sources in the frequency range 30 MHz-1 GHz.
采用时域电磁干扰测量系统,根据电磁兼容标准预测系统的辐射发射
根据EMC标准FCC、CISPR和MIL进行完全合规性测试的测量必须使用必须显示标准中规定行为的emi接收器。为了预测系统的电磁干扰,分别在频域和时域进行了仿真。今天,像计算机主板或汽车系统这样的复杂系统由各种部件组成,这些部件的排放可以用统计模型来描述。我们提出了一种时域电磁干扰(TDEMI)测量系统,该系统观察输入信号并生成统计模型。该模型用于获得可以在EMI接收器的各种检测器模式下评估的频谱。TDEMI系统将测量时间减少了约50倍。本文表明,时域电磁干扰测量系统可以预测由多个特征分量组成的系统的电磁干扰。每个源发射的统计模型和耦合模型被用来获得描述整个系统的统计模型。单源辐射的统计模型可以通过测量或系统级模拟得到。通过现场求解工具得到了耦合模型。利用所得到的全系统统计模型,得到了可在峰、准峰、平均和均方根检测器下评估的光谱。作为一个由两个频率范围为30 MHz-1 GHz的源组成的系统的例子,用钻机和笔记本电脑进行了测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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