{"title":"Information fusion method in fault modes","authors":"Weiwei Hu, Jin Qi, H. Mou, Yufeng Sun","doi":"10.1109/PHM.2012.6228815","DOIUrl":null,"url":null,"abstract":"With more and more importance attached on the reliability of electronic products, in order to solve the problems occurred during the fault diagnosis and reasoning of electronic products, this paper takes the simulation-based circuit signal as the project, and in-depth studies information fusion methods for failure mode identification. Then this paper establishes the information fusion model of the fault circuit, and raises the basic probability distribution function for the neural network and enriched the applications of the DS evidence theory. In the end the failure mode identification of the circuit was achieved, which provided support for a higher level to fault reasoning.","PeriodicalId":444815,"journal":{"name":"Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PHM.2012.6228815","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
With more and more importance attached on the reliability of electronic products, in order to solve the problems occurred during the fault diagnosis and reasoning of electronic products, this paper takes the simulation-based circuit signal as the project, and in-depth studies information fusion methods for failure mode identification. Then this paper establishes the information fusion model of the fault circuit, and raises the basic probability distribution function for the neural network and enriched the applications of the DS evidence theory. In the end the failure mode identification of the circuit was achieved, which provided support for a higher level to fault reasoning.