Flexible Thin-Film Transistors with Vertical In-Ga-Zn-O Channel Using Atomic-Layer Deposition on Poly(Ethylene Naphthalate) Substrate

Hyeong-Rae Kim, Ji-Hee Yang, G. Kim, Sung‐Min Yoon
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引用次数: 2

Abstract

A flexible vertical-channel structure thin-film transistor (VTFT) was proposed and fabricated on poly(ethylene naphthalate) (PEN) substrate. All the layers composing the gate-stack including an In-Ga-Zn-O (IGZO) active channel were prepared by atomic-layer deposition except for source and drain electrodes. A polyimide was introduced as a spacer material and a dry etch process was designed to form the vertical sidewalls. The fabricated flexible IGZO VTFTs exhibited sound transfer characteristics showing the on/off ratio of 1.8×102. The threshold voltage instabilities were estimated to be +6.1 V/-4.5 V under the positive/negative bias stress tests, respectively. The device characteristics did not show any marked degradation even after the substrate delamination and even under the bending state at a curvature radius of 10 mm.
基于聚萘二甲酸乙酯基板原子层沉积的垂直In-Ga-Zn-O沟道柔性薄膜晶体管
提出了一种柔性垂直沟道结构薄膜晶体管(VTFT),并在聚萘二甲酸乙酯(PEN)衬底上进行了制备。除了源极和漏极外,构成栅极堆的所有层(包括In-Ga-Zn-O (IGZO)有源通道)均采用原子层沉积法制备。引入聚酰亚胺作为间隔材料,并设计了干蚀刻工艺来形成垂直侧壁。制备的柔性IGZO vtft具有良好的声传递特性,通/关比为1.8×102。在正/负偏置应力测试下,估计阈值电压不稳定性分别为+6.1 V/-4.5 V。即使在衬底分层后,即使在曲率半径为10 mm的弯曲状态下,器件特性也没有表现出任何明显的退化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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