Hyeong-Rae Kim, Ji-Hee Yang, G. Kim, Sung‐Min Yoon
{"title":"Flexible Thin-Film Transistors with Vertical In-Ga-Zn-O Channel Using Atomic-Layer Deposition on Poly(Ethylene Naphthalate) Substrate","authors":"Hyeong-Rae Kim, Ji-Hee Yang, G. Kim, Sung‐Min Yoon","doi":"10.23919/AM-FPD.2018.8437376","DOIUrl":null,"url":null,"abstract":"A flexible vertical-channel structure thin-film transistor (VTFT) was proposed and fabricated on poly(ethylene naphthalate) (PEN) substrate. All the layers composing the gate-stack including an In-Ga-Zn-O (IGZO) active channel were prepared by atomic-layer deposition except for source and drain electrodes. A polyimide was introduced as a spacer material and a dry etch process was designed to form the vertical sidewalls. The fabricated flexible IGZO VTFTs exhibited sound transfer characteristics showing the on/off ratio of 1.8×102. The threshold voltage instabilities were estimated to be +6.1 V/-4.5 V under the positive/negative bias stress tests, respectively. The device characteristics did not show any marked degradation even after the substrate delamination and even under the bending state at a curvature radius of 10 mm.","PeriodicalId":221271,"journal":{"name":"2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AM-FPD.2018.8437376","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A flexible vertical-channel structure thin-film transistor (VTFT) was proposed and fabricated on poly(ethylene naphthalate) (PEN) substrate. All the layers composing the gate-stack including an In-Ga-Zn-O (IGZO) active channel were prepared by atomic-layer deposition except for source and drain electrodes. A polyimide was introduced as a spacer material and a dry etch process was designed to form the vertical sidewalls. The fabricated flexible IGZO VTFTs exhibited sound transfer characteristics showing the on/off ratio of 1.8×102. The threshold voltage instabilities were estimated to be +6.1 V/-4.5 V under the positive/negative bias stress tests, respectively. The device characteristics did not show any marked degradation even after the substrate delamination and even under the bending state at a curvature radius of 10 mm.