{"title":"The lapse analysis of waveguide meter of electromagnetic materials parameters","authors":"V. Salamatin, G. V. Lemeshko","doi":"10.1109/CRMICO.2008.4676589","DOIUrl":null,"url":null,"abstract":"The results of analysis of waveguide meter of electromagnetic materials parameters based of short circuit waveguide are presented. Measurement conditions effect on definition accuracy of parameters of investigated material is observed.","PeriodicalId":328074,"journal":{"name":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 18th International Crimean Conference - Microwave & Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2008.4676589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The results of analysis of waveguide meter of electromagnetic materials parameters based of short circuit waveguide are presented. Measurement conditions effect on definition accuracy of parameters of investigated material is observed.